372 search results - page 39 / 75 » On the Fault Testing for Reversible Circuits |
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
VLSID
1996
IEEE
13 years 11 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
INTEGRATION
2006
13 years 7 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
TC
1998
13 years 7 months ago
1998
—Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q << k, a process termed space compaction. The ...
TASE
2009
IEEE
14 years 2 months ago
2009
IEEE
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...