372 search results - page 52 / 75 » On the Fault Testing for Reversible Circuits |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...