372 search results - page 59 / 75 » On the Fault Testing for Reversible Circuits |
ISCAS
2003
IEEE
14 years 23 days ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
FPL
2011
Springer
12 years 7 months ago
2011
Springer
—On-chip Physical Unclonable Functions (PUFs) are emerging as a powerful security primitive that can potentially solve several security problems. A PUF needs to be robust against...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— To ensure security and robustness of the next generation of Physically Unclonable Functions (PUFs), we have developed a new methodology for PUF design. Our approach employs int...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...