This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
Sampling error due to jitter, or noise in the sample times, affects the precision of analog-to-digital converters in a significant, nonlinear fashion. In this paper, a polynomial...