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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
14 years 10 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
ISQED
2009
IEEE
328views Hardware» more  ISQED 2009»
14 years 4 months ago
VLSI architectures of perceptual based video watermarking for real-time copyright protection
For effective digital rights management (DRM) of multimedia in the framework of embedded systems, both watermarking and cryptography are necessary. In this paper, we present a wat...
Saraju P. Mohanty, Elias Kougianos, Wei Cai, Manis...
DATE
2007
IEEE
184views Hardware» more  DATE 2007»
14 years 4 months ago
New safety critical radio altimeter for airbus and related design flow
The latest generation of the ERT560 Digital Radio Altimeter (DRA) developed for the Airbus A380 is the result of Thales’ 40 years experience. Over 40,000 radio-altimeters have b...
D. Hairion, S. Emeriau, E. Combot, Michel Sarlotte
FGCN
2007
IEEE
111views Communications» more  FGCN 2007»
14 years 4 months ago
Consistency Issue on Live Systems Forensics
Volatile data, being vital to digital investigation, have become part of the standard items targeted in the course of live response to a computer system. In traditional computer f...
Frank Y. W. Law, K. P. Chow, Michael Y. K. Kwan, P...
SEMWEB
2007
Springer
14 years 4 months ago
Privacy and Capability Management for the European eIDM Framework
The natural evolution of eGovernment is to go beyond the management of identities and therefore it is necessary to manage people, companies or organizations, and their capabilities...
Mario Reyes-Ayala, Ignacio Alamillo, Daniel Chavar...