229 search results - page 10 / 46 » On-Chip Test Generation Using Linear Subspaces |
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
ECCV
2008
Springer
14 years 9 months ago
2008
Springer
Visual tracking is a challenging problem, as an object may change its appearance due to viewpoint variations, illumination changes, and occlusion. Also, an object may leave the fie...
ICASSP
2011
IEEE
12 years 11 months ago
2011
IEEE
Linear discriminant analysis (LDA) is a widely used feature extraction method for classification. We introduce distributed implementations of different versions of LDA, suitable ...
AMC
2005
13 years 7 months ago
2005
A class of efficient preconditioners based on Daubechies family of wavelets for sparse, unsymmetric linear systems that arise in numerical solution of Partial Differential Equatio...