229 search results - page 18 / 46 » On-Chip Test Generation Using Linear Subspaces |
DATE
2000
IEEE
14 years 2 days ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
CVPR
2012
IEEE
11 years 10 months ago
2012
IEEE
Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one of two extreme options: mat...
MIA
2010
13 years 2 months ago
2010
We propose a framework for intensity-based registration of images by linear transformations, based on a discrete Markov Random Field (MRF) formulation. Here, the challenge arises ...
KES
2004
Springer
14 years 1 months ago
2004
Springer
There is now a huge amount of high quality photometric data available in the literature whose analysis is bound to play a fundamental role in studies of the formation and evolution...
ET
2002
13 years 7 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...