Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
We are interested in computing tail probabilities for the maxima of Gaussian random fields. In this paper, we discuss two special cases: random fields defined over a finite number...
For any Boolean functionf letL(f) be its formulasizecomplexityin the basis f^ 1g. For every n and every k n=2, we describe a probabilistic distribution on formulas in the basis f^...
In this paper, we study the problem of data gathering in multi-hop wireless sensor networks. To tackle the high degree of channel contention and high probability of packet collisi...
Abstract. We analyze a model of fault-tolerant systems in a probabilistic setting. The model has been introduced under the name of “sabotage games”. A reachability problem over...
Dominik Klein, Frank G. Radmacher, Wolfgang Thomas