We propose a procedure for designing an LFSRbased circuit for masking of unknown output values that appear in the output response of a circuit tested using LBIST. The procedure is...
Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, S...
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...