Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Abstract. Increasing integration densities and the emergence of nanotechnology cause issues related to reliability and power consumption to become dominant factors for the design o...
Tim Wegner, Claas Cornelius, Andreas Tockhorn, Dir...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...