261 search results - page 11 / 53 » Optimal Hardware Pattern Generation for Functional BIST |
124
Voted
ET
2002
15 years 2 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
86
Voted
DSD
2007
IEEE
15 years 9 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
127
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DSD
2005
IEEE
15 years 4 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
67
Voted
DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
This paper presents a practical implementation of a network analyzer for analog BIST applications. The network analyzer consists of a sinewave generator and a sinewave evaluator b...
126
Voted
ATS
2009
IEEE
15 years 7 months ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...