In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
This paper presents a practical implementation of a network analyzer for analog BIST applications. The network analyzer consists of a sinewave generator and a sinewave evaluator b...
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...