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» Optimal Hardware Pattern Generation for Functional BIST
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ISCAS
2008
IEEE
112views Hardware» more  ISCAS 2008»
14 years 1 months ago
Power optimization of weighted bit-product summation tree for elementary function generator
— In this paper we propose a method for lowering the power consumption in our previously proposed method for approximating elementary functions. By rearranging the interconnect o...
Saeeid Tahmasbi Oskuii, Kenny Johansson, Oscar Gus...
DATE
2005
IEEE
116views Hardware» more  DATE 2005»
14 years 1 months ago
FORAY-GEN: Automatic Generation of Affine Functions for Memory Optimizations
In today’s embedded applications a significant portion of energy is spent in the memory subsystem. Several approaches have been proposed to minimize this energy, including the u...
Ilya Issenin, Nikil D. Dutt
DSN
2002
IEEE
14 years 15 days ago
Detecting Processor Hardware Faults by Means of Automatically Generated Virtual Duplex Systems
A virtual duplex system (VDS) can be used to increase safety without the use of structural redundancy on a single machine. If a deterministic program P is calculating a given func...
Markus Jochim
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 13 days ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 1 months ago
An Infrastructure to Functionally Test Designs Generated by Compilers Targeting FPGAs
This paper presents an infrastructure to test the functionality of the specific architectures output by a highlevel compiler targeting dynamically reconfigurable hardware. It resu...
Rui Rodrigues, João M. P. Cardoso