Background: There are many data mining methods but few comparisons between them. For example, there are at least two ways to build quality optimizers, programs that find project o...
Adaptive Random Testing subsumes a class of algorithms that detect the first failure with less test cases than Random Testing. The present paper shows that a "reference metho...
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....
Though verification tools are finding industrial use, the utility of engineering optimizations that make them scalable and usable is not widely known. Despite the fact that seve...