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DATE
2006
IEEE

Optimal periodic testing of intermittent faults in embedded pipelined processor applications

14 years 5 months ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability failures that are manifested in the field during the semiconductor product operation. Since SoftwareBased Self-Test (SBST) has been proposed as an effective strategy for on-line testing of processors integrated in non-safety critical low-cost embedded system applications, optimal test period specification is becoming increasingly challenging. In this paper we first introduce a reliability analysis for optimal periodic testing of intermittent faults that minimizes the test cost incurred based on a two-state Markov model for the probabilistic modeling of intermittent faults. Then, we present for the first time an enhanced SBST strategy for on-line testing of complex pipelined embedded processors. Finally, we demonstrate the effectiveness of the proposed optimal periodic SBST strategy by applying it to a fully-pipel...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar
Added 10 Jun 2010
Updated 10 Jun 2010
Type Conference
Year 2006
Where DATE
Authors Nektarios Kranitis, Andreas Merentitis, N. Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis
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