8398 search results - page 34 / 1680 » Optimal Software Testing |
TCAD
2008
13 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
KDD
2000
ACM
14 years 1 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ACSE
2000
ACM
14 years 2 months ago
2000
ACM
Although testing accounts for 50% of the cost of software, it receives little treatment in most curricula. This paper presents some approaches to giving all students multiple, inc...
PDSE
1998
13 years 11 months ago
1998
With the advancement in network speed and computing power; distributed multimedia applications are becoming populal: However;generalprinciples of system testing cannot be directly...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
