Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
Current distributed database and stream processing systems assume that the network connecting nodes in the data processor is "always on," and that the absence of a netwo...
Yang Zhang, Bret Hull, Hari Balakrishnan, Samuel M...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
This paper presents a new fault injection tool called Exhaustif (Exhaustive Workbench for Systems Reliability). Exhaustif is a SWIFI fault injection tool for fault tolerance verif...
Dynamic voltage scaling (DVS) algorithms save energy by scaling down the processor frequency when the processor is not fully loaded. Many algorithms have been proposed for periodi...