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ITC
2003
IEEE
129views Hardware» more  ITC 2003»
14 years 2 months ago
Relating Yield Models to Burn-In Fall-Out in Time
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Thomas S. Barnett, Adit D. Singh
SSDBM
2003
IEEE
136views Database» more  SSDBM 2003»
14 years 2 months ago
Acceleration of Relational Index Structures Based on Statistics
Relational index structures, as for instance the Relational Interval Tree, the Relational R-Tree, or the Linear Quadtree, support efficient processing of queries on top of existin...
Hans-Peter Kriegel, Peter Kunath, Martin Pfeifle, ...
COMPGEOM
2003
ACM
14 years 2 months ago
Billboard clouds
We introduce billboard clouds – a new approach for extreme simplification in the context of real-time rendering. 3D models are simplified onto a set of planes with texture and...
Xavier Décoret, Frédo Durand, Fran&c...
CHES
2003
Springer
100views Cryptology» more  CHES 2003»
14 years 2 months ago
Multi-channel Attacks
We introduce multi-channel attacks, i.e., side-channel attacks which utilize multiple side-channels such as power and EM simultaneously. We propose an adversarial model which combi...
Dakshi Agrawal, Josyula R. Rao, Pankaj Rohatgi
DIGITALCITIES
2003
Springer
14 years 2 months ago
Visualizing Social Patterns in Virtual Environments on a Local and Global Scale
Today a wide variety of virtual worlds, cities, gaming environments etc. exist and become part of life of their human inhabitants. However, our understanding on how technology infl...
Katy Börner, Shashikant Penumarthy, Bonnie Je...