1063 search results - page 73 / 213 » Order and Negation as Failure |
VLSID
2008
IEEE
14 years 10 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
ISQED
2010
IEEE
14 years 4 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ICFCA
2007
Springer
14 years 4 months ago
2007
Springer
We model a Digital Library as a formal context in which objects are documents and attributes are terms describing documents contents. A formal concept is very close to the notion o...
IJCNN
2006
IEEE
14 years 4 months ago
2006
IEEE
— This paper proposes a novel method of fusing models for classification of unbalanced data. The unbalanced data contains a majority of healthy (negative) instances, and a minor...