Sciweavers

257 search results - page 6 / 52
» Packet-Based Input Test Data Compression Techniques
Sort
View
ISSTA
1998
ACM
13 years 11 months ago
Automatic Test Data Generation Using Constraint Solving Techniques
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
Arnaud Gotlieb, Bernard Botella, Michel Rueher
ICCD
1999
IEEE
93views Hardware» more  ICCD 1999»
13 years 11 months ago
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
Abhijit Jas, Nur A. Touba
DATE
2003
IEEE
128views Hardware» more  DATE 2003»
14 years 19 days ago
Virtual Compression through Test Vector Stitching for Scan Based Designs
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
Wenjing Rao, Alex Orailoglu
CPM
2010
Springer
175views Combinatorics» more  CPM 2010»
14 years 4 days ago
Compression, Indexing, and Retrieval for Massive String Data
The field of compressed data structures seeks to achieve fast search time, but using a compressed representation, ideally requiring less space than that occupied by the original i...
Wing-Kai Hon, Rahul Shah, Jeffrey Scott Vitter
DAC
2005
ACM
13 years 9 months ago
Response compaction with any number of unknowns using a new LFSR architecture
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
Erik H. Volkerink, Subhasish Mitra