34 search results - page 6 / 7 » Parallel fault backtracing for calculation of fault coverage |
IEEEPACT
2008
IEEE
14 years 3 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
DFT
2004
IEEE
14 years 10 days ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
IPPS
2005
IEEE
14 years 2 months ago
2005
IEEE
An important problem in wireless networks, such as wireless ad hoc and sensor networks, is to select a few nodes to form a virtual backbone that supports routing and other tasks s...
CCGRID
2010
IEEE
13 years 9 months ago
2010
IEEE
Although shared memory programming models show good programmability compared to message passing programming models, their implementation by page-based software distributed shared m...