134 search results - page 13 / 27 » Parallelism through Digital Circuit Design |
ASAP
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
SIAMCOMP
2000
13 years 7 months ago
2000
We consider a system of uniform recurrence equations (URE) of dimension one. We show how its computation can be carried out using minimal memory size with several synchronous proc...
SBCCI
2006
ACM
14 years 1 months ago
2006
ACM
The design of a low-power differential switched-capacitor amplifier for processing a fully-differential input signal coming from a pressure sensor interface is reported. The circu...
FPGA
2010
ACM
13 years 5 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
The use of nanometer technologies is making it increasingly important to consider transient characteristics of a circuit’s power dissipation (e.g., peak power, and power gradien...