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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 1 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
CIKM
2007
Springer
14 years 1 months ago
A dual-view approach to interactive network visualization
Visualizing network data, from tree structures to arbitrarily connected graphs, is a difficult problem in information visualization. A large part of the problem is that in network...
Galileo Namata, Brian Staats, Lise Getoor, Ben Shn...
IPSN
2007
Springer
14 years 1 months ago
The regiment macroprogramming system
The development of high-level programming environments is essential if wireless sensor networks are to be accessible to nonexperts. In this paper, we present the Regiment system, ...
Ryan Newton, Greg Morrisett, Matt Welsh
LCPC
2007
Springer
14 years 1 months ago
Modeling Relations between Inputs and Dynamic Behavior for General Programs
Program dynamic optimization, adaptive to runtime behavior changes, has become increasingly important for both performance and energy savings. However, most runtime optimizations o...
Xipeng Shen, Feng Mao
INFOVIS
2005
IEEE
14 years 29 days ago
Importance-Driven Visualization Layouts for Large Time Series Data
Time series are an important type of data with applications in virtually every aspect of the real world. Often a large number of time series have to be monitored and analyzed in p...
Ming C. Hao, Umeshwar Dayal, Daniel A. Keim, Tobia...