35 search results - page 5 / 7 » Parametric yield estimation considering leakage variability |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
— The worst-case delay/power of function units has been used in traditional high level synthesis to facilitate design space exploration. As technology scales to nanometer regime,...
NECO
2011
13 years 2 months ago
2011
Selection of an optimal estimator typically relies on either supervised training samples (pairs of measurements and their associated true values), or a prior probability model for...
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
MICCAI
2009
Springer
14 years 9 months ago
2009
Springer
Segmentation of medical images is commonly formulated as a supervised learning problem, where manually labeled training data are summarized using a parametric atlas. Summarizing th...