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» Partitioning of VLSI Circuits and Systems
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VLSID
2008
IEEE
117views VLSI» more  VLSID 2008»
14 years 9 months ago
Single Event Upset: An Embedded Tutorial
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
Fan Wang, Vishwani D. Agrawal
CSUR
2006
147views more  CSUR 2006»
13 years 8 months ago
A survey of research and practices of Network-on-chip
resents a perspective on existing NoC research. We define the following abstractions: system, network adapter, network, and link to explain and structure the fundamental concepts. ...
Tobias Bjerregaard, Shankar Mahadevan
DAC
2005
ACM
14 years 9 months ago
Incremental exploration of the combined physical and behavioral design space
Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...
Zhenyu (Peter) Gu, Jia Wang, Robert P. Dick, Hai Z...
TCAD
2008
89views more  TCAD 2008»
13 years 8 months ago
A New Multilevel Framework for Large-Scale Interconnect-Driven Floorplanning
We present in this paper a new interconnect-driven multilevel floorplanner, called interconnect-driven multilevelfloorplanning framework (IMF), to handle large-scale buildingmodule...
Tung-Chieh Chen, Yao-Wen Chang, Shyh-Chang Lin
TCAD
2010
136views more  TCAD 2010»
13 years 3 months ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris