193 search results - page 8 / 39 » Patching Processor Design Errors |
MICRO
2003
IEEE
14 years 1 months ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
APCSAC
2004
IEEE
14 years 11 days ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
ASPLOS
2010
ACM
14 years 3 months ago
2010
ACM
Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individ...
MICRO
2011
IEEE
13 years 10 days ago
2011
IEEE
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
CAD
2005
Springer
13 years 8 months ago
2005
Springer
This paper presents a novel feature based parameterization approach of human bodies from the unorganized cloud points and the parametric design method for generating new models ba...