This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
Generative model learning is one of the key problems in machine learning and computer vision. Currently the use of generative models is limited due to the difficulty in effective...
—Modern applications such as web knowledge base, network traffic monitoring and online social networks have made available an unprecedented amount of network data with rich type...
Feature selection is a critical procedure in many pattern recognition applications. There are two distinct mechanisms for feature selection namely the wrapper methods and the filte...
Michal Haindl, Petr Somol, Dimitrios Ververidis, C...