758 search results - page 35 / 152 » Pattern-Constrained Test Case Generation |
128
Voted
DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
122
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DATE
1997
IEEE
15 years 6 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
ASPDAC
2006
ACM
15 years 8 months ago
2006
ACM
– An instruction set level reference model was developed for the development of synergistic processing unit (SPU) , which is one of the key components of the cell processor [1][2...
123
Voted
DMIN
2006
15 years 3 months ago
2006
- Filtering the immense amount of data available electronically over the World Wide Web is an important task of search engines in data mining applications. Users when performing se...
148
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GECCO
2005
Springer
15 years 8 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...