5439 search results - page 24 / 1088 » Patterns: from system design to software testing |
DDECS
2009
IEEE
13 years 11 months ago
2009
IEEE
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
CISIS
2010
IEEE
13 years 11 months ago
2010
IEEE
— Production automation systems consist of many entities (like robots and shuttles) that interact in complex ways to provide the overall system functionality like product assembl...
PDSE
1998
13 years 8 months ago
1998
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...