5799 search results - page 33 / 1160 » Patterns Generate Architectures |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
SDM
2008
SIAM
13 years 9 months ago
2008
SIAM
Sequential pattern mining first proposed by Agrawal and Srikant has received intensive research due to its wide range applicability in many real-life domains. Various improvements...
ADMA
2008
Springer
13 years 10 months ago
2008
Springer
In this paper, we study the maintenance of frequent patterns in the context of the generator representation. The generator representation is a concise and lossless representation o...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ISCAS
1999
IEEE
14 years 5 days ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...