5799 search results - page 59 / 1160 » Patterns Generate Architectures |
JCNS
2008
13 years 6 months ago
2008
PKDD
2010
Springer
13 years 6 months ago
2010
Springer
DAC
2006
ACM
14 years 9 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
IDEAS
2005
IEEE
14 years 1 months ago
2005
IEEE
The resource requirements of frequent pattern mining algorithms depend mainly on the length distribution of the mined patterns in the database. Synthetic databases, which are used...