64 search results - page 4 / 13 » Penetration Testing with Improved Input Vector Identificatio... |
ITC
2003
IEEE
14 years 28 days ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
TIT
2010
13 years 2 months ago
2010
Compressed sensing (CS) has recently emerged as a powerful signal acquisition paradigm. In essence, CS enables the recovery of high-dimensional sparse signals from relatively few ...
ATS
2000
IEEE
14 years 2 days ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...