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ISLPED
2006
ACM
83views Hardware» more  ISLPED 2006»
14 years 1 months ago
Considering process variations during system-level power analysis
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...
ICDM
2010
IEEE
122views Data Mining» more  ICDM 2010»
13 years 5 months ago
Interesting Subset Discovery and Its Application on Service Processes
Various real-life datasets can be viewed as a set of records consisting of attributes explaining the records and set of measures evaluating the records. In this paper, we address t...
Maitreya Natu, Girish Keshav Palshikar
DAC
2007
ACM
14 years 8 months ago
Fast Second-Order Statistical Static Timing Analysis Using Parameter Dimension Reduction
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Zhuo Feng, Peng Li, Yaping Zhan
CODES
2004
IEEE
13 years 11 months ago
A loop accelerator for low power embedded VLIW processors
The high transistor density afforded by modern VLSI processes have enabled the design of embedded processors that use clustered execution units to deliver high levels of performan...
Binu K. Mathew, Al Davis
PPOPP
1993
ACM
13 years 11 months ago
Experience with Fine-Grain Synchronization in MIMD Machines for Preconditioned Conjugate Gradient
This paper discusses our experience with fine-grain synchronization for a variant of the preconditioned conjugate gradient method. This algorithm represents a large class of algo...
Donald Yeung, Anant Agarwal