Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
Individual dies in 3D integrated circuits are connected using throughsilicon-vias (TSVs). TSVs not only increase manufacturing cost, but also incur silicon area, delay, and power ...
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
As semiconductor feature sizes decrease, interconnect delay is becoming a dominant component of processor cycle times. This creates a critical need to shift microarchitectural des...