At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...