We introduce a dynamic battery model that describes the variations of the capacity of a battery under time varying discharge current. This model supports a co-design approach for ...
DSM and nanometer VLSI designs are subject to an increasingly significant thermal effect on VLSI circuit lifetime and performance variation, which can be effectively subdued by V...
Deep-submicron designs have to take care of process variation effects as variations in critical process parameters result in large variations in access latencies of hardware compo...
— The lack of robust tamper-proofing techniques in security applications has provided attackers the ability to virtually circumvent mathematically strong cryptographic primitive...
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...