301 search results - page 9 / 61 » Physical design techniques for optimizing RTA-induced variat... |
ICDCSW
2009
IEEE
14 years 3 months ago
2009
IEEE
We introduce a dynamic battery model that describes the variations of the capacity of a battery under time varying discharge current. This model supports a co-design approach for ...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
DSM and nanometer VLSI designs are subject to an increasingly significant thermal effect on VLSI circuit lifetime and performance variation, which can be effectively subdued by V...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Deep-submicron designs have to take care of process variation effects as variations in critical process parameters result in large variations in access latencies of hardware compo...
ISCAS
2008
IEEE
14 years 2 months ago
2008
IEEE
— The lack of robust tamper-proofing techniques in security applications has provided attackers the ability to virtually circumvent mathematically strong cryptographic primitive...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...