35 search results - page 6 / 7 » Polynomial Identity Testing for Depth 3 Circuits |
COLT
2008
Springer
13 years 10 months ago
2008
Springer
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
EMMCVPR
2011
Springer
12 years 8 months ago
2011
Springer
The challenge of recovering the topology of massive neuronal circuits can potentially be met by high throughput Electron Microscopy (EM) imagery. Segmenting a 3-dimensional stack o...
AVSS
2007
IEEE
13 years 8 months ago
2007
IEEE
A novel surveillance system integrating 2D and 3D facial data is presented in this paper, based on a low-cost sensor capable of real-time acquisition of 3D images and associated c...
ASPDAC
1998
ACM
14 years 24 days ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
DAC
2008
ACM
14 years 9 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...