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DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
WOSS
2004
ACM
14 years 1 months ago
2004
ACM
This paper describes an online control framework to design self-managing distributed computing systems that continually optimize their performance in response to changing computin...
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
ICDCS
2006
IEEE
14 years 1 months ago
2006
IEEE
Internet distance prediction gives pair-wise latency information with limited measurements. Recent studies have revealed that the quality of existing prediction mechanisms from th...
HPCC
2007
Springer
14 years 1 months ago
2007
Springer
We propose a model for describing the parallel performance of multigrid software on distributed memory architectures. The goal of the model is to allow reliable predictions to be m...