1419 search results - page 105 / 284 » Power Droop Testing |
151
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TCS
2010
15 years 26 days ago
2010
There has been much interest in testing from finite state machines (FSMs) as a result of their suitability for modelling or specifying state-based systems. Where there are multip...
111
Voted
FPGA
2006
ACM
15 years 6 months ago
2006
ACM
Embedded memory blocks are important resources in contemporary FPGA devices. When targeting FPGAs, application designers often specify high-level memory functions which exhibit a ...
142
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AIA
2007
15 years 4 months ago
2007
Designers aim at fast but low-power consuming integrated circuits. Since high processing speed always comes with high energy demands, the literature provides several ways to reduc...
125
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DAC
2010
ACM
15 years 2 months ago
2010
ACM
Many DTM schemes rely heavily on the accurate knowledge of the chip's dynamic thermal state to make optimal performance/ temperature trade-off decisions. This information is ...
104
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ICASSP
2010
IEEE
15 years 2 months ago
2010
IEEE
Mismatch between training and test conditions deteriorates the performance of speech recognizers. This paper investigates the combination of parametric histogram equalization (pHE...