1419 search results - page 20 / 284 » Power Droop Testing |
DFT
2002
IEEE
14 years 2 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
EOR
2011
13 years 4 months ago
2011
A simple game is a pair consisting of a finite set N of players and a set W ⊆ 2N of winning coalitions. (Vector-)weighted majority games ((V)WMG) are a special case of simple ga...
ISCAS
2005
IEEE
14 years 3 months ago
2005
IEEE
—This paper presents and compares three circuit architectures that are promising candidates to efficiently and dynamically supply GSM and EDGE RF power amplifiers in handsets. Th...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
ECCC
2011
13 years 4 months ago
2011
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...