1419 search results - page 25 / 284 » Power Droop Testing |
TODAES
2011
13 years 4 months ago
2011
—In this paper, we present an attack on stream cipher implementations by determining the scan chain structure of the linear feedback shift registers in their implementations. Alt...
ISSRE
2007
IEEE
13 years 11 months ago
2007
IEEE
VTS
2000
IEEE
14 years 2 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
DFT
1999
IEEE
14 years 2 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...