1419 search results - page 47 / 284 » Power Droop Testing |
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
FORTE
1996
13 years 11 months ago
1996
In this paper we present the application of the fair testing pre-order, introduced in a previous paper, to the speci cation and analysis of distributed systems. This pre-order com...
HASE
1998
IEEE
14 years 2 months ago
1998
IEEE
It is widely accepted that the OO paradigm will signi cantly increase software reusability, extendibility, interoperability, and reliability. This is also true for high assurance ...
AGILEDC
2004
IEEE
14 years 1 months ago
2004
IEEE
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...