1419 search results - page 58 / 284 » Power Droop Testing |
ICSM
2005
IEEE
14 years 3 months ago
2005
IEEE
Testing plays an important role in the maintenance of Component Based Software Development. Test adequacy for component testing is one of the hardest issues for component testing....
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
POPL
2010
ACM
14 years 7 months ago
2010
ACM
Program analysis tools typically compute two types of information: (1) may information that is true of all program executions and is used to prove the absence of bugs in the progr...
PLDI
2009
ACM
14 years 4 months ago
2009
ACM
Symbolic analysis shows promise as a foundation for bug-finding, specification inference, verification, and test generation. This paper addresses demand-driven symbolic analysi...
VLSID
2007
IEEE
14 years 10 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...