1419 search results - page 7 / 284 » Power Droop Testing |
JMLR
2012
12 years 7 days ago
2012
The problem of curve registration appears in many different areas of applications ranging from neuroscience to road traffic modeling. In the present work, we propose a nonparamet...
INFORMATICALT
2011
13 years 4 months ago
2011
It is well known that in situations involving the study of large datasets where influential observations or outliers maybe present, regression models based on the Maximum Likeliho...
VTS
2008
IEEE
14 years 4 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
GI
2007
Springer
14 years 4 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
FORMATS
2009
Springer
14 years 4 months ago
2009
Springer
For software development, testing is still the primary choice for investigating the correctness of a system. Automated testing is of utmost importance to support continuous integra...