7 search results - page 1 / 2 » Power Supply Transient Signal Analysis Under Real Process an... |
VTS
2002
IEEE
14 years 3 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
ICCAD
2003
IEEE
14 years 7 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
VTS
2000
IEEE
14 years 3 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ITC
2000
IEEE
14 years 3 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...