Studies have shown much of today’s data centers are over-provisioned and underutilized. Over-provisioning cannot be avoided as these centers must anticipate peak load with burst...
In Hwan Doh, Young Jin Kim, Jung Soo Park, Eunsam ...
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
Topology control problems are concerned with the assignment of power values to the nodes of an ad hoc network so that the power assignment leads to a graph topology satisfying som...
Errol L. Lloyd, Rui Liu, Madhav V. Marathe, Ram Ra...
In embedded cryptosystems, sensitive information can leak via timing, power, and electromagnetic channels. We introduce a novel power-smart system-on-chip architecture that provid...
Radu Muresan, Haleh Vahedi, Y. Zhanrong, Stefano G...
Abstract-- We present a novel formulation of the problem of energy misbehavior and develop an analytical framework for quantifying its impact on other nodes. Specifically, we formu...