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ET
2002
122views more  ET 2002»
15 years 3 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
CGA
1998
15 years 3 months ago
Principles for Information Visualization Spreadsheets
ns, with large, abstract, multidimensional data sets that are visually represented in multiple ways. We illustrate how spreadsheet techniques provide a structured, intuitive, and p...
Ed Huai-hsin Chi, John Riedl, Phillip Barry, Josep...
MJ
2007
119views more  MJ 2007»
15 years 3 months ago
Automated energy calculation and estimation for delay-insensitive digital circuits
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
Venkat Satagopan, Bonita Bhaskaran, Anshul Singh, ...
RAS
2007
148views more  RAS 2007»
15 years 3 months ago
Including probabilistic target detection attributes into map representations
Range measuring sensors can play an extremely important role in robot navigation. All range measuring devices rely on a ‘detection criterion’ made in the presence of noise, to...
John Mullane, Ebi Jose, Martin David Adams, Wijeru...
MA
2010
Springer
153views Communications» more  MA 2010»
15 years 2 months ago
Testing quasi-independence for truncation data
Quasi-independence is a common assumption for analyzing truncated data. To verify this condition, we consider a class of weighted log-rank type statistics that include existing te...
Takeshi Emura, Weijing Wang