1522 search results - page 248 / 305 » Practical Exception Specifications |
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
With the adoption of ultra regular fabric paradigms for controlling design printability at the 22nm node and beyond, there is an emerging need for a layout-driven, pattern-based p...
ECCV
2008
Springer
14 years 11 months ago
2008
Springer
Abstract. We describe a new method for unsupervised structure learning of a hierarchical compositional model (HCM) for deformable objects. The learning is unsupervised in the sense...
ECCV
2002
Springer
14 years 11 months ago
2002
Springer
Abstract. Multi-sampled imaging is a general framework for using pixels on an image detector to simultaneously sample multiple dimensions of imaging (space, time, spectrum, brightn...
ICDE
2007
IEEE
14 years 10 months ago
2007
IEEE
Active Data Warehousing has emerged as an alternative to conventional warehousing practices in order to meet the high demand of applications for up-to-date information. In a nutsh...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...