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SAC
2002
ACM
13 years 7 months ago
An evolutionary algorithm for reducing integrated-circuit test application time
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
SEUS
2007
IEEE
14 years 2 months ago
A Framework for Hardware-in-the-Loop Testing of an Integrated Architecture
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
Martin Schlager, Roman Obermaisser, Wilfried Elmen...
DICS
2006
13 years 10 months ago
Dependable Software
Achieving software reliability takes many complementary techniques, directed at the process or at the products. This survey summarizes some of the most fruitful ideas. 1 OVERVIEW ...
Bertrand Meyer
GECCO
2003
Springer
113views Optimization» more  GECCO 2003»
14 years 1 months ago
Predicate Expression Cost Functions to Guide Evolutionary Search for Test Data
Several researchers are using evolutionary search methods to search for test data with which to test a program. The fitness or cost function depends on the test goal but almost in...
Leonardo Bottaci
SOFTVIS
2010
ACM
13 years 5 months ago
Dependence cluster visualization
Large clusters of mutual dependence have long been regarded as a problem impeding comprehension, testing, maintenance, and reverse engineering. An effective visualization can aid ...
Syed S. Islam, Jens Krinke, David Binkley