3819 search results - page 128 / 764 » Predicting Dependability by Testing |
ET
2002
13 years 7 months ago
2002
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
MA
2010
Springer
13 years 6 months ago
2010
Springer
A general approach for developing distribution free tests for general linear models based on simplicial depth is applied to multiple regression. The tests are based on the asympto...
ICSEA
2009
IEEE
14 years 2 months ago
2009
IEEE
—In this paper, an integrated approach for cross platform automated software builds and the implementation of a test framework is described. The system introduced here utilizes s...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
Evidence suggests that as software ages the original realizations of design patterns remain in place, and participants in design pattern realizations accumulate “grime” – no...