Structural Fault Based Specification Reduction for Testing Analog Circuits

Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is proposed and demonstrated. It starts with first deriving relationships between specifications and parameter variations of the circuit-under-test (CUT) and then reduces specifications by considering bounds of parameter variations. A statistical approach by taking into account of circuit fabrication process fluctuation is also employed and the result shows that the specification reduction depends on the testing confidence. A continuous-time state-variable benchmark filter circuit is applied with this methodology to demonstrate the effectiveness of the approach.

• Type: Journal
• Year: 2002
• Where: ET
• Authors: Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen
• Keywords: ET 2002, Parameter Variations, Specification, Specification Reduction